We develop a compact physics model for hot-copyright degradation (HCD) that is valid over a wide range of gate and drain voltages (Vgs and Vds. respectively). Special attention is paid to the contribution of secondary carriers (generated by impact ionization) to HCD. which was shown to be significant under stress conditions with low Vgs and relatively high Vds. https://medicalwarehouses.shop/product-category/walkers-rollators/